Scanning Electron Microscope(30kV)
Product Code : EL-SLE-15045
Scanning Electron Microscope for Materials Analysis, ZEISS EVO ‘or equivalent’
• For advanced metallurgical testing and analysis on materials in order to detect surface and internal flaws, determine microstructural features, evaluate heat treatments and establish the causes of failure.
• A resolution of 1.9nm @ 30kV SE with HD
• Total Magnification 5X to 1,000,000X with largest chamber size
• Acceleration voltage of 0.2 to 30kV